SolidSpec - 3700/3700DUV UV-Vis-NIR Spectrophotometer

Availablity: EXW

Catalog/Part Number: UV 3700i/3700i DUV
Brand: SHIMADZU
Supplier: SHIMADZU
Supplier Location: JAPAN
Inventory Weight: 170 kg
Unit of Measurement:
Inventory Brochure: 1567602329.pdf |

Catalog/Part Number:: UV 3700i/3700i DUV

Description

Shimadzu’s top-of-the-line SolidSpec-3700/3700DUV series UV-VIS-NIR spectrophotometers have been designed to address the needs of the electronics and optics markets. Two models are available: the 3700 for standard applications and the 3700DUV for deep UV measurement to 165 nm. Large sample compartments ensure easy measurement while maintaining sample integrity while a wide variety of accessories, including the Automatic X-Y Stage for automated measurements, expands their applications.


FEATURES High Sensitivity The SolidSpec-3700 and 3700DUV are equipped with three detectors: a photomultiplier tube (PMT) detector for the ultraviolet and visible region; InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region significantly high. Deep UV Measurement
The SolidSpec-3700DUV has the capability to measure the deep ultraviolet region down to 165nm(note) (or to 175nm with an integrating sphere) by purging both the optical and the sample compartment with nitrogen gas. Large Sample Compartment

The large sample compartment (900W x 700D x 350H mm) allows large samples to be measured without destroying the sample. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The whole sample area of 12 inches or 310 x 310 mm samples is measurable by mounting the automatic X-Y stage (option).


APPLICATION FPD:High-sensitivity measurement in NIR and a large sample compartment for material evaluation Semiconductors:Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement Optical communications:High-sensitivity measurement of anti-reflection films in NIR

Optics:High-sensitivity measurement from deep UV to NIR, and a large sample compartment


https://shimadzugroup.sharepoint.com/sites/gcs/an_sales/Literature/Distributor/MolecularSpectroscopy/UV/c101e172.pdf

Catalog/Part Number: UV 3700i/3700i DUV Category:

Technical Specifications


Wavelength range

SolidSpec-3700i (Standard) 240 to 2,600 nm when using the direct light receiving unit: 190 to 3,300 nm

SolidSpec-3700i DUV (DUV): 175 to 2,600 nm when using the direct light receiving unit: 165 to 3,300 nm

Spectral bandwidth
UV/VIS 0.1, 0.2, 0.5, 1, 2, 3, 5, 8 nm (8-step switcheable) NIR 0.2, 0.5, 1, 2, 3, 5, 8, 12, 20, 32 nm (10-step switcheable)
Wavelength setting
0.1 nm increments (1 nm increments when setting scanning range)
Wavelength sampling pitch
0.01 nm
Wavelength accuracy
UV/VIS:±0.2 nm, NIR:±0.8 nm
Wavelength repeatability
UV/VIS:Within ±0.08 nm , NIR:WIthin±0.32 nm
Wavelength scanning speed

Wavelength transfer:

UV/VIS:Approx. 18,000 nm/min

NIR:Approx. 70,000 nm/min

Wavelength scan rate: UV/VIS:Max Approx. 4,500 nm/min

NIR PMT/InGaAs:Max Approx. 9,000 nm/min

NIR PbS:Max Approx. 4,000 nm/min

Lamp interchange wavelength
Auto switching synchronized with wavelength; switching range selectable between 282 and 393 nm (0.1 nm increments)
Stray light

0.00008% or less (220 nm, NaI)

0.00005% or less (340 nm, NaNO2)

0.0005% or less (1,420 nm, H2O)

0.005% or less (2,365 nm, CHCl3)

Photometric system
Double beam optics 

https://shimadzugroup.sharepoint.com/sites/gcs/an_sales/Literature/Distributor/MolecularSpectroscopy/UV/c101e167.PDF

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