EDX-LE

Description

The EDX-LE is an energy dispersive X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its detector (Si-PIN semiconductor detector) does not require liquid nitrogen, thereby achieving lower operational costs and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.
The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.

FEATURES

1. Model designed specifically for RoHS/ELV screening

EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.

The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. The model is recommended for taking measures for step 2 of China RoHS.

       2. Exceptional labor-saving, high-speed screening

Lower operation cost, easier maintenance
Provides specific functions necessary for screening the five RoHS regulated elements
Easy set-up functions can be customized according to the management method

https://shimadzugroup.sharepoint.com/sites/gcs/an_sales/Literature/Distributor/ElementalAnalysis/XRF/c142e035d.pdf